Category Innovation/ R&D

Peer To Patent System May Become Model For Patent Offices

By Liza Porteus Viana for Intellectual Property Watch
A pilot patent peer review system in the United States could serve as a model for patent offices around the globe.

New York Law School, in cooperation with the US Patent and Trademark Office, is in its second year of Peer To Patent, an innovative initiative that opens the patent examination process to public participation. The online system allows the public to supply prior art to assess the claims of pending patent applications. The goal is to provide patent examiners with as much information as possible, and ultimately increase the quality of approved patents.